Modulated optical reflectance characterisation of superconducting thin films and microwave devices.

摘要

Comparisons are presented of room temperature modulated optical reflectance (MOR) and low temperature electron beam iinduced voltage contrast (EBIV) studies of thin film high temperature superconductor (HTS) microwave resonators. A strong correlation is shown between MOR and EBIV mesurements showing MOR to provide a room temperature high spatial resolution inciation of HTS properties. The relationship between microwave properties and film defects. revealed by MOR, is discussed.