Current profiling algorithms for highest accuracy and maximum depth

摘要

The SW2OOO Doppler Current Profiler utilizes an FET (Fast Fourier Transform) process to extract the Doppler shift from the received reverberation signal. The Doppler received in each depth cell on the various beams is then resolved to provide thethree U,V and W current vectors. This paper discusses some of the enhancements and features of this process designed to assure highest accuracy and maximum depth performance from a ship borne profiler.