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Failure modes, mechanisms and analysis methods for a microcontroller-based System on Chip (SoC)

机译:基于微控制器的芯片(SOC)的失效模式,机制和分析方法

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Different failure modes on a microcontroller-based SoC are presented. Several steps in the analysis needed to find the failure mechanism as well as prove "non-fails" amidst the maze of false positives and false trails, second-order effects, confusion and other challenges due to product complexity and the device's interaction with the embedded firmware (FW) are also discussed. The cases presented in this paper tackle issues that are related to FW, non-volatile memory (NVM), digital logic and analog modules.
机译:呈现了基于微控制器的SOC上的不同故障模式。分析中的几个步骤可以找到失败机制,并且在迷彩阳性和假小径的迷宫中证明“非失败”,二阶效果,混乱等挑战,由于产品复杂性和设备与嵌入式的互动还讨论了固件(FW)。本文提出的案例与FW,非易失性存储器(NVM),数字逻辑和模拟模块相关的问题。

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