Cycle Time Reductions for Test Area Bottleneck Equipment

摘要

Using discrete-event simulation models, a study was conducted to evaluate the current production practices of a high-volume semiconductor assembly and test operation. The specific goal of the study was to find potential areas for productivity improvement that would collectively yield a 60% reduction in manufacturing cycle time for the back-end factory. This paper will present findings and measurable results pertaining to the Burn-In and Tester operations, which are the current factory constraints. The model shows that the cumulative impact of these recommendations is a 32% reduction in average cycle time, a significant contribution to the overall goal. Additional opportunities are being investigated with models of the Assembly area.