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Investigation of nanofriction and nano-scale properties of silica surface using atomic force microscopy

机译:用原子力显微镜研究二氧化硅表面的纳米型和纳米尺度特性

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The nano-scale surface roughness and the nanofriction of silica surface were measured in ambient condition using atomic force microscopy(AFM). The nano-scale properties of the sample were investigated The correlation between the fractal property and frictional coefficient of the silica surface was investigated It has been found that the frictional force is proportional to load. The surface adhension force and elastical modulus of silica surface were measured. Moreover, The nanoscale dynamic processes during the tip of AFM contacting the surface of sample were analysed Therefore, it is possible to link the nano-scale properties of sample with its nanofriction behavior.
机译:使用原子力显微镜(AFM)在环境条件下测量二氧化硅表面的纳米尺度表面粗糙度和纳米尺度。研究了样品的纳米级特性,研究了二氧化硅表面的分形性质和摩擦系数之间的相关性研究,其中已经发现摩擦力与负载成比例。测量表面粘合力和二氧化硅表面的弹性模量。此外,分析了AFM尖端在接触样品表面的纳米级动态过程,因此可以将样品的纳米级特性与其纳米反抗行为联系起来。

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