End-to-end modeling of the photometric performance of LCD projection system using Monte Carlo geometrical ray tracing methods is an accurate and precise tool for predicting and improving the performance of these deices before, during and after product development. However, an accurate simulation first requires considering which physical properties contribute most to the system's photometric performance. Second, these properties must be characterized by physical measurements and translated into the tangible modeling parameters of a ray tracing program. Third, the implications of using a Monte Carlo ray tracing algorithm, and in general any other optical transformation algorithm, on radiometric accuracy must be well understood. These considerations as well as a generalized approach to the characterization and simulation of an LCD projector are described. A commercially available ray tracing program, the Advanced Systems Analysis Program, is used to demonstrate this approach. The irradiance uniformity, CIE color performance and screen brightness of an arc source LCD projector system are computed as an example.
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