Magneto-optic and electron beam-induced voltage contrast studies of YBCO thin films

摘要

Magneto-optic (MO) and electron beam-induced voltage contrast (EBIV) techniques have been employed to study YBa_2Cu_3O_(7-x) (YBCO) microbridges on patterned SrTiO_3, substrates. Correlation has been observed between magnetic flux shielding in YBCO microbridges from MO measurements and local mapping of critical currents from EBIV. Low critical current density (J_c) regions of the track were found to correspond to stepped areas, with MO indicating that flux penetration occurred first at these regions. Correlation between MO and EBIV on microbridges with low J_c was not obtained due to the difficulty in obtaining MO measurements.