We have developed and tested an experimental method to correct an image, H_s(x,y) of a superconducting thin film sample which is scanned with a scanning SQUID microscope. This technique uses the simultaneous records of image and amplitude A_2 of the second harmonic of the modulation frequency. The variations in A_2 are proportional to the changes of the mutual inductance, M(x,y), between the SQUID and the feedback coil which changes drastically due to screening by the sample.
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