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Flight x-ray CCD selection for the AXAF CCD Imaging Spectrometer

机译:用于AXAF CCD成像光谱仪的飞行X射线CCD选择

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摘要

As part of our program to select and calibrate flight- quality, x-ray CCD detectors for the AXAF CCD imaging spectrometer, we have developed efficient detector screening methods. Our screening protocol, which measures device-level performance parameters (including noise, dark current and charge transfer efficiency) as well as x-ray spectral resolution in the 0.3 - 6 keV band, allows us quickly to identify which of the greater than 30 flight candidate detectors warrant the expenditure of severely limited time available for calibration. The performance criteria used to rank devices are discussed, and the details of the measurement methods are presented. Summary results of the screening measurements are presented for a large sample of devices, and detailed data on selected devices are described. We find that the performance variations among the sample of flight devices to be relatively small but significant.
机译:作为我们的程序的一部分,用于选择和校准飞行质量,用于AXAF CCD成像光谱仪的X射线CCD探测器,我们已经开发了有效的探测器筛选方法。我们的筛选方案,测量设备级性能参数(包括噪声,暗电流和电荷转移效率)以及0.3 - 6 KeV频段中的X射线谱分辨率,允许我们快速识别大于30飞行中的哪一个候选探测器保证可用于校准的严重限制时间的支出。讨论了用于等级设备的性能标准,并提出了测量方法的细节。筛选测量结果呈现出用于大型设备样本,并且描述了关于所选设备的详细数据。我们发现飞行装置样本中的性能变化相对较小但很重要。

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