首页> 外文会议>Conference on EUV,X-Ray,and Gamma-Ray Instrumentation for Astronomy >Light yield and Fano factor for x rays in xenon gas proportional scintillation counters
【24h】

Light yield and Fano factor for x rays in xenon gas proportional scintillation counters

机译:氙气成比例闪烁计数器X射线的光产量和Fano因子

获取原文
获取外文期刊封面目录资料

摘要

The light yield, or electroluminescence yield, of pure xenon for reduced electric fields below the ionization threshold (about 6 Vcm$+$MIN@1$/torr$+$MIN@1$/) was measured for pressures of 825, 570 and 276 torr using a uniform field gas proportional scintillation counter excited with 5.9 keV x rays. A linear behavior was exhibited from the 1 Vcm$+$MIN@1$/torr$+$MIN@1$/ electroluminescence threshold, but the measured yield (for lambda greater than 165 nm) diminished with the gas pressure. The best energy resolution obtained was 7.6% for collimated 5.9 keV x rays with xenon at 825 torr. A Fano factor of 0.26 was measured for the three xenon pressures.
机译:用于降低电离阈值的纯氙的光屈服或电致发光产率(约6瓦米$ + $ + $ / @ 1 $ / torr + $ min @ 1 $ /),以持续825,570和276托特使用均匀的野外气体比例闪烁计数器,用5.9 kev x射线激发。从1 $ / Torr + $ + $ min @ 1 $ /电致发光阈值展出了线性行为,但在气压下测量的产量(对于λ大于165nm)。获得的最佳能量分辨率为7.6%,用于在825托的825托处与氙的准直的5.9 kev x光线。测量三个氙气压力的Fano因子0.26。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号