首页> 外文会议>Conference on Photodetectors and Power Meters >Smart detectors: devices integration circuits and systems
【24h】

Smart detectors: devices integration circuits and systems

机译:智能探测器:设备集成电路和系统

获取原文

摘要

The fabrication and performance of thin film p-i-n and metal-semiconductor-metal (MSM) photodetectors and the integration of these detectors onto silicon circuitry is presented. The thin film photodetectors are separated from the growth substrate using epitaxial lift off or total substrate removal, and are subsequently bonded to silicon circuits. Performance of the thin film photodetectors is comparable to on-wafer counterparts, and in the cases of resonant cavity p-i-ns and inverted (fingers on the bottom) MSMs, the performance is enhanced through the removal of the substrate. Receiver circuits have been designed, integrated with thin film photodetectors, and tested. Finally, smart pixel arrays of photodetectors have been integrated directly on top of an array of silicon oscillator circuits to demonstrate three dimensionally interconnected image processing systems.
机译:呈薄膜P-I-N和金属半导体 - 金属(MSM)光电探测器的制造和性能以及这些探测器在硅电路上的集成。薄膜光电探测器使用外延升降或总基板去除与生长衬底分离,随后与硅电路粘合。薄膜光电探测器的性能与晶片上的对应物相当,并且在谐振腔P-I-Ns和倒置的情况下(底部的指状物)MSM,通过去除基板来增强性能。接收器电路已经设计,与薄膜光电探测器集成并测试。最后,光电探测器的智能像素阵列直接集成在硅振荡器电路阵列的顶部,以演示三维互连的图像处理系统。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号