Fatigue crack growth of randomly excited structures

摘要

The fatigue failure of a randomly excited structure is treated as the growth of a dominant crack to a prescribed critical size. Approximating such a crack as a Markov process, analytical and numerical results are obtained of the structural reliability, and the probability density and statistical moments of the fatigue life in the case of a narrow-band Gaussian stress process. Correlation among the successive stress cycles, which induce the crack growth, is taken into account.