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Gray-track damage in KTiOPO4 crystals

机译:Ktiopo4晶体中的灰度损坏

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摘要

A correlation is observed between the laser and electric-field damage susceptibilities of most KTiOPO$-4$/ (KTP) crystals. The observed gray track damage susceptibilities are found to be correlated to the concentrations of defects in the crystals which can stabilize the Ti$+3$PLU$/ damage defect sites in KTP. These stabilizing defects are those which can have an effective positive charge, such as oxygen vacancies, protons, and Ba and F impurities. The defects present in KTP crystals depend on the technique (hydrothermal or flux) used for growth. Post-growth processing techniques have been developed which reduce the laser gray track and electric-field damage susceptibilities of both hydrothermal and flux KTP.
机译:在大多数Ktiopo -4 $ /(KTP)晶体的激光和电场损伤敏感度之间观察到相关性。发现观察到的灰色轨道损伤敏感性与晶体中的缺陷的浓度相关,这可以稳定KTP中的TI $ + 3 $ PLU /损坏缺陷网站。这些稳定缺陷是可以具有有效正电荷的缺陷,例如氧空位,质子和BA和F杂质。 KTP晶体中存在的缺陷取决于用于生长的技术(水热或助熔剂)。已经开发出生长后的加工技术,其减少了热热和助焊剂KTP的激光灰度和电场损伤敏感性。

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