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Latent design faults in the development of Multiflow's TRACE/200

机译:多利迹线/ 200发展中的潜在设计故障

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The author recounts some of the more notable design faults that appeared during the development of the Multiflow TRACE/200 series of minisupercomputers. During development of the TRACE, the design errors found appeared to be largely random and uncorrelated. However, it appears that a fairly small set of categories can nearly span the set. These faults fall roughly into a few categories: interface misassumptions, stale-instructions-in-cache, parity-related, designer errors, CAD tools, and parts with defective designs. Specific examples are given for each category, and corrections for these design flaws are mentioned.
机译:作者叙述了一些在Mu​​ltiflow Trace / 200系列矿物计算机开发期间出现的一些更值得注意的设计故障。在轨迹的开发期间,发现的设计错误似乎是大部分随机和不相关的。但是,似乎是一部相当小的类别可以跨越套装。这些故障粗略地分为几种类别:界面误解,高速缓存,与奇偶校验相关的,设计师错误,CAD工具和具有有缺陷设计的零件。针对每个类别给出具体示例,提到了这些设计缺陷的校正。

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