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Empirical bounds on fault coverage loss due to LFSR aliasing

机译:LFSR别名引起的故障覆盖损失的经验范围

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Linear-feedback shift registers (LFSRs) are often used to compact test responses. Prior analyses, based on statistically-independent error models, have predicted that aliasing probability 'converges' to 2/sup -k/ for LFSR polynomials of degree k, and that primitive polynomials perform better than nonprimitive polynomials. This paper presents the first statistical results based on full fault simulation that confirm these predictions. However, the average aliasing probability is not by itself a useful measure of the loss of fault detection information; the authors introduce an upper confidence limit (UCL) for the loss of fault coverage. The 'ideal' UCL is shown to match closely the empirically-derived UCL.
机译:线性反馈移位寄存器(LFSR)通常用于紧凑的测试响应。基于统计学上独立的误差模型的先前分析预测,校有概率“收敛到2 / sup -k /用于等级k的LFSR多项式,并且该原始多项式比非金素多项式更好地执行。本文介绍了基于完全故障模拟的第一个统计结果,确认这些预测。但是,平均锯齿概率本身并不是一种有用的故障检测信息丢失的衡量标准;作者为丢失故障覆盖率引入了上限(UCL)。 “理想”的UCL被证明可以密切匹配经验衍生的UCL。

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