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Experimental determination of factors influencing contact Experimental contact erosion by the electrical arc

机译:电弧影响接触实验接触侵蚀的因素的实验确定

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The objective of this work is the experimental determination of the factors influencing contact erosion by the electrical arc in low voltage switches, in order to characterize and reduce the most detrimental factors. The erosion phenomenon and behavior have been studied using endurance tests performed over up to 30,000 opening/closing cycles on sample switches whose contacts are made of AgNi, for three different values of closing and opening speed, and for three different values of initial gap between the fixed and the mobile contact. The experimental tests have been carried out under an assigned alternative voltage of 250 V, an assigned current of 16 A, and an inductive-load power-factor of 0.6. Tests have been done on real switches from the production line, while the contact gap and opening/closing speed effects have been examined on isolated contacts. Based on contact weight determination and electron microscope images, different erosion behaviors have been observed for AgNi contacts, whether based on mass loss or surface structural changes. Current and voltage monitoring and recording during the tests for different number of cycles (700, 1200, 15600 and 30000) have shown that the electrical arc duration is random and independant of number of cycles. Endurance tests on isolated contacts for different initial contact gap (2 mm, 4 mm, and 6 mm) and for different opening speed (4 cm/s, 5.5 cm/s and 7 cm/s) have featured that the mobility of one contact relative to the other is a very important factor for erosion, and that the mass loss and transfer phenomenon is not equilibrated between the two contacts even though the current is alternating. However the mass transfer is always done from the mobile contact towards the fixed one. In real switch endurance tests, contamination of the contacts by carbonaceous deposits, coming from the electrically insulated wall of the switch apparatus by thermal erosion, have masked the contact mass loss due to arc erosion and have shown the magnitude and importance of these phenomena especially in comparison with results obtained on isolated contacts.
机译:这项工作的目的是实验确定低压开关中电弧影响接触侵蚀的因素,以表征和降低最有害的因素。已经使用耐久性测试研究了侵蚀现象和行为,该耐久性测试在样本开关上进行了多达30,000个打开/关闭循环,其触点由AGNI制成,用于三种不同的关闭和开度值,以及三种不同的初始间隙值固定和移动联系人。实验测试已经在分配的替代电压下进行,250 V,分配电流为16a,电感负载功率因数为0.6。从生产线上的真实开关进行了测试,而在隔离触点上检查了接触间隙和打开/关闭速度效果。基于接触重量测定和电子显微镜图像,针对Agni触点观察到不同的侵蚀行为,无论是基于质量损失还是表面结构变化。在不同数量的循环(700,1200,15600和30000)的测试期间的电流和电压监测和记录已经表明,电弧持续时间是随机循环的循环次数的独立。用于不同初始接触间隙(2mm,4mm,6毫米)和不同开口速度(4cm / s,5.5cm / s和7cm / s)的隔离触点的耐力试验具有一个接触的移动性相对于另一个是侵蚀的一个非常重要的因素,并且即使电流交替,两个触点之间的质量损失和转移现象也不会平衡。然而,传质始终从移动接触到固定的传感器完成。在实际开关耐久性测试中,通过热侵蚀从开关设备的电绝缘壁的碳质沉积物污染,由于电弧侵蚀而掩盖了接触质量损失,并且尤其是这些现象的大小和重要性与隔离触点获得的结果进行比较。

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