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Highly (110)-Oriented Potassium Niobate Thin Films Prepared by RF-Magnetron Sputtering

机译:高度(110) - 通过RF-磁控溅射制备的铌酸钾薄膜

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Epitaxial (110)-oriented KNbO{sub}3 thin films were deposited on a (100) MgO substrate by RF-magnetron sputtering. To clarify the sputtering conditions necessary for obtaining a highly oriented KNbO{sub}3 thin film, the relationships among the degree of orientation, the composition ratio of K/Nb, and the lattice plane spacing were evaluated for KNbO{sub}3 thin films sputtered using several types of targets. In the deposition method using dual targets of KNbO{sub}3 and K{sub}2CO{sub}3, a higher orientation and a larger K/Nb ratio were incompatible. In single-target sputtering with a mixture target of KNbO{sub}3:K{sub}2CO{sub}3, as the substrate temperature was decreased, although the K/Nb ratio increased and the (220)-plane spacing approached that of orthorhombic bulk KNbO{sub}3, the orientation deteriorated. Using a single K-rich target, K{sub}5NbO{sub}x, containing no CO{sub}2, a highly (110)-oriented KNbO{sub}3 thin film with a K/Nb ratio of 0.40 and a (220)-plane spacing close to that of orthorhombic bulk KNbO{sub}3 was obtained by increasing the RF power applied to the O{sub}2-radical source. Moreover, the displacement current in the KNbO{sub}3 thin film was observed when an electric field was applied to the interdigital transducer formed on the thin film. It is considered that this indicates the existence of spontaneous polarization in the KNbO{sub}3 thin film.
机译:通过RF-磁控溅射沉积在(100)MgO底物上沉积在(100)MgO底物上的外延(110)的薄膜。为了阐明获得高度面向的KNO {Sub} 3薄膜所需的溅射条件,对KNO {Sub} 3薄膜评估了取向程度,K / Nb的组成比和晶格平面间距之间的关系使用几种类型的目标溅射。在使用KNBO {SUB} 3和K {SUB} 2CO {SUB} 3的双目标的沉积方法中,更高的方向和较大的K / NB比率不兼容。在单靶溅射中,具有KNBO {SUB} 3:K {SUB} 2CO {SUB} 3的混合靶,因为基板温度降低,尽管K / NB比增加了(220)平面间距接近正交散装KNO {SUB} 3,取向劣化。使用单个k的目标,k {sub} 5nbo {sub} x,包含没有co {sub} 2,高度(110)的Knbo {sub} 3薄膜,其K / NB比为0.40和a (220)通过增加施加到O {Sub} 2自由基源的RF功率获得接近正交散装KNO {SUB} 3的平面间隔。此外,当将电场施加到形成在薄膜上形成的瞬间换能器时,观察到KNO {SUB} 3薄膜中的位移电流。认为这表明了KNO {SUB} 3薄膜中的自发极化存在。

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