Laser excited fluorescence probes to study insulator damage

摘要

Laser-excited fluorescent (LEF) probes are being investigated as a means of detecting low level electrical damage in insulators. These dyes selectively fluoresce at certain damage sites, showing the location and nature of the damage. The fluorescence characteristics differ for each dye, making it possible to focus on specific kinds of damage by judicious choice of dyes. This technique is sensitive enough to detect very low level damage, which makes it a good tool for studying pre-catastrophic electrical damage.