首页> 外文会议>Conference on Interferometry >Effect of defocused fringe on measured profile in structured line projection method
【24h】

Effect of defocused fringe on measured profile in structured line projection method

机译:散焦边缘对结构线投影法测量轮廓的影响

获取原文

摘要

In industry, there are needs to accurately measure the 3-D profile of edges parts in order to evaluate edge condition. Optical methods are increasingly used for this purpose due to its advantages such as being non-contact, fast, accurate, and easy to integrate with software for data acquisition and feature analysis. We utilized structured line projection technology to measure edge's profile. In this method a structured light distribution, created by the transmission of a sinusoidal grating, was projected onto the inspected parts at a certain incidence angle. The projected light lines were deformed due to the depth change on the edge surface. A CCD camera sitting at a different angle was used to record the deformed fringes. From the deformed fringes the 3D surface profile was extracted based on triangulation principal. Because the projected grating pattern can be interpreted as an interference pattern, we used the spatial carrier phase shifting and phase unwrapping method as in classic interferometry to extract the phase information from the intensity distribution of fringes. Due to the limited depth-of-range of the fringe image and depth-of-focus of the imaging lens on the CCD camera, the observed deformed fringes have different widths and frequencies at different depth. According to the definition of depth-of-focus, the fringe width out of focus can be on the order of the square root of 2 wider than that which is in focus. The width change can also be due to a tilt across the object. This width change affects the accuracy of the spatial carrier phase shifting and subsequently the accuracy of extracted profile. In this paper, we proposed to monitor the change of the fringe width with imaging depth. According to the width of the fringes, we defined a parameter called compressing rate, to use in computing the edge profile. For different edge types, the compressing rate was optimized in order to get the profile that can match the results from traditional the methods. By using this method, the system repeatability can be improved significantly.
机译:在工业中,需要准确地测量边缘部件的3-D型材以便评估边缘条件。由于其优点,因此,光学方法越来越多地用于此目的,例如与数据采集和特征分析的软件无接触,快速,准确,易于集成。我们利用了结构化线路投影技术来测量边缘的配置文件。在该方法中,通过正弦光栅的传输产生的结构化光分布以一定的入射角突出到检查的部件上。由于边缘表面的深度变化,投影光线变形。坐在不同角度的CCD摄像机用于记录变形的条纹。从变形的条纹,基于三角测量主体提取3D表面轮廓。因为投影光栅图案可以被解释为干涉图案,所以我们使用了空间载波相移和相位展开方法,如在经典的干涉测量中,以提取来自FRINE的强度分布的相位信息。由于CCD摄像机上的成像镜头的边缘图像和焦点的深度范围和对焦的浓度,所观察到的变形条纹在不同深度处具有不同的宽度和频率。根据对焦的定义,焦点外的条纹宽度可以是2宽的平方根的顺序,而不是焦点的平方根。宽度变化也可能是由于横跨对象的倾斜。该宽度变化影响空间载波相移的精度,并随后提取的轮廓的精度。在本文中,我们建议监测与成像深度的边缘宽度的变化。根据条纹的宽度,我们定义了一种称为压缩速率的参数,用于计算边缘轮廓。对于不同的边缘类型,优化了压缩速率,以便获取可以与传统方法匹配结果的配置文件。通过使用该方法,可以显着提高系统重复性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号