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XUV gratings based on holography

机译:基于全息术的XUV光栅

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摘要

In addition to applications based on particle accelerator sources the XUV wavelength range is interesting for several further fields of research - for example in astronomy. On one hand, due to the short wavelengths a diffraction grating for these applications must provide a high-quality surface figure of its polished grating substrate or blank. On the other hand, the grating profile must be very smooth with no relevant phase errors to provide high diffraction efficiency as well as minimum stray light levels. Due to these challenging specifications it is advantageous if a manufacturer has access to lithographic technologies and sophisticated polishing processes at once. For instance, it is sometimes crucial to adapt the polishing to the employed technology chain in order to reach optimum grating performance. Furthermore, a capable grating manufacturing technology should enable flexible line distributions ranging from equally spaced lines on plane or curved substrates up to variable-line-spacing gratings (VLS) as well as even curved lines for imaging grating types in general. Grating surface figures ranging from plane, spherical and cylindrical up to freeform and in case of beamline optics for grazing incidence operation mode - comparable massive grating blanks must be manageable as well. By employing holographic exposure in combination with new and state-of-the-art etching techniques it is feasible to address all the mentioned features. We will address the degrees of freedom in grating design arising due to holographic pattern definition and present latest improvements that go beyond the so far reported status of XUV grating manufacturing. Beside the flexibility of holography to achieve excellent roughness and best peak efficiency on silicon the option for local blaze adaption can be extremely beneficial. Thus, it will be in the focus of this text.
机译:除了基于粒子加速器源的应用外,XUV波长范围对于几个研究领域而言是有趣的 - 例如在天文学中。一方面,由于短波长的衍射光栅用于这些应用必须提供其抛光光栅基板或坯料的高质量表面图。另一方面,光栅轮廓必须非常光滑,没有相关的相位误差以提供高衍射效率以及最小杂散光水平。由于这些具有挑战性的规格,如果制造商能够一次性访问光刻技术和复杂的抛光过程是有利的。例如,适应所采用的技术链的抛光有时是至关重要的,以达到最佳的光栅性能。此外,一种能够的光栅制造技术应使得能够从平面上的等间隔线或弯曲的基板上的柔性线分布,其达到可变线 - 间隔光栅(VLS)以及用于成像光栅类型的偶数曲线。光栅表面图测距从平面,球形和圆柱形到自由形式,并且在用于放牧入射操作模式的光束线光学的情况下,也必须可管理的相当的巨大光栅坯料。通过与新的和最先进的蚀刻技术结合使用全息曝光,可以解决所有提到的特征是可行的。由于全息模式定义,我们将解决引发的光栅设计的自由度,并提出超出到目前为止报告的XUV光栅制造状态的最新改进。除了全息术的灵活性,在硅上实现优异的粗糙度和最佳峰值效率,局部布兰泽适应的选择可能是非常有益的。因此,它将是本文的重点。

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