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A Non-Reflective T/R Switch with Leakage Cancellation Technique for 5G mm Wave Application

机译:具有泄漏消除技术的非反射T / R开关,用于5G MM波应用

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In this paper, a transmitter/receiver (T/R) single-pole double-throw (SPDT) switch is designed with a new leakage cancellation topology for high T/R isolation within 24.25~29.5 GHz and fabricated with the 0.15 µm GaAs pHEMT technology. The proposed leakage cancellation structure consists of two pHMETs and a series 50Ω resistor sandwiched by two 90° phase shifters. It provides wideband isolation and non-reflective characteristic at the isolated port. The measured insertion loss is smaller than 1.37 dB and the isolation is higher than 26.7 dB, within the whole 24.25~29.5 GHz band for 5G millimeter-wave application. The minimum insertion loss and the maximum T/R isolation are achieved as 1.07 dB and 47 dB respectively both at 24.3 GHz. The chip core occupies the area of 0.45x0.56 mm2.
机译:在本文中,发射器/接收器(T / R)单极双掷(SPDT)开关设计,具有在24.25〜29.5 GHz内的高T / R隔离的新泄漏消除拓扑结构,并用0.15μmGaAsPhemt制造技术。所提出的泄漏消除结构由两个PHMET和夹在两个90°移相器的50Ω电阻组成。它在隔离端口提供宽带隔离和非反射特性。测量的插入损耗小于1.37dB,分离高于26.7dB,在整个24.25〜29.5 GHz带中为5g毫米波应用。最小插入损耗和最大T / R隔离分别在24.3GHz下实现为1.07dB和47 dB。芯片芯占面积0.45x0.56 mm 2

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