IEEE recommended practice for powering and grounding electronic equipment. (Color Book Series - Emerald Book)

摘要

This paper analyzes the different types of test escape with thefinal objective to propose a solution to minimize some of the testescapes. Using a simple example of short defect in the context ofBoolean testing, it is first demonstrated that the defect behaviordepends on unpredictable parameters. It is shown that a defect may bedetectable with a vector but for a given domain of the unpredictableparameter called the Detection Domain. Using the concept of DetectionDomain, 3 different types of test escape are identified. It is thendemonstrated that one type of test escape can be minimized using`Improved fault models'