首页> 外文会议>Electrical Design of Advanced Packaging and Systems Symposium, 2008 >Extraction of material properties for low-K and low-loss dielectrics using cavity resonator and efficient finite difference solver up to 40GHz
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Extraction of material properties for low-K and low-loss dielectrics using cavity resonator and efficient finite difference solver up to 40GHz

机译:使用腔谐振器和高达40GHz的高效有限差分求解器提取低K和低损耗电介质的材料特性

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Liquid crystal polymer (LCP) has been used as an RF substrate material for the packaging. As the technology continues to improve, LCP does not satisfy all of the thickness requirements for mobile applications. Therefore, a new dielectric material (Material-A) has been developed, which can be extremely thin and has a lower processing temperature than LCP. To accurately extract Material-A properties, we present a new extraction method which has a major advantage over the previously published techniques especially for low dielectric and low loss dielectrics. In this paper, the new method has been applied for extracting the frequency-dependent dielectric constant and loss tangent up to 40GHz for Material-A, and a Debye model that satisfies the causality has been developed.
机译:液晶聚合物(LCP)已用作封装的RF基板材料。随着技术的不断改进,LCP不能满足移动应用的所有厚度要求。因此,已经开发了一种新的介电材料(材料A),它可以非常薄并且具有比LCP更低的处理温度。为了准确地提取材料A的特性,我们提出了一种新的提取方法,该方法相对于以前发布的技术具有主要优势,尤其是对于低介电常数和低损耗介电常数而言。本文将这种新方法应用于材料A提取频率高达40GHz的频率相关介电常数和损耗角正切,并建立了满足因果关系的Debye模型。

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