A method is proposed for a simultaneous measurement of theresistivity and permeability of a film by measuring the difference inthe composite impedance of a pair of coils placed on both sides of thesample film facing each other. In first case, the current passes throughthe coils in the same direction and in second case, the current passesthrough the coils in opposite directions to each other. It wastheoretically found that the optimum frequency for the measurement wasproportional to the resistivity and inversely proportional to thethickness of a sample film in the case of paramagnetic films. Thismethod was tested by measuring the resistivity of copper and brass filmsof a thickness ranging from 0.01 to 0.08 mm, and by simultaneouslymeasuring the resistivity and permeability of nickel films of athickness of 0.01 and 0.02 mm. The measured values of the resistivitywith this method have correlated well with the values measured with thedc four-point probe method
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