Thermal imaging is critical to the study of heat transport in electronic and optoelectronic devices, particularly with regard to understanding the impact of heat on device operating efficiency, performance, and lifetime. Among thermal imaging techniques, lock-in thermoreflectance (TR) microscopy using a CCD detector offers the advantage of non-contact measurement, and has been shown to provide high thermal and spatial resolutions (10mK, 250nm), over a large imaging area [1].
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