首页> 外文会议>IEEE Symposium on VLSI Technology >First Direct Experimental Studies of Hf0.5Zr0.5O2 Ferroelectric Polarization Switching Down to 100-picosecond in Sub-60mV/dec Germanium Ferroelectric Nanowire FETs
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First Direct Experimental Studies of Hf0.5Zr0.5O2 Ferroelectric Polarization Switching Down to 100-picosecond in Sub-60mV/dec Germanium Ferroelectric Nanowire FETs

机译:在亚60mV / dec锗铁电纳米线FET中Hf 0.5 Zr 0.5 O 2 铁电极化转换至100皮秒的直接实验研究

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In this work, ultrafast pulses with pulse widths ranging from 100 ps to seconds were applied on the gate of Ge ferroelectric (FE) nanowire (NW) pFETs with FE Hf0.5Zr0.5O2 (HZO) gate dielectric exhibiting steep subthreshold slope (SS) below 60 mV/dec bi-directionally. With applied gate bias pulses (VG = -1 to -10 V), high-mobility Ge drain current was monitored as a test vehicle to capture the polarization switching of HZO. It was found that HZO could switch its polarization directly by a single pulse with the minimum pulse width of 3.6 ns. The polarization switching triggered by pulse train with pulse width as short as 100 ps was demonstrated for the first time.
机译:在这项工作中,将脉冲宽度范围从100 ps到秒的超快脉冲施加到具有FE Hf的Ge铁电(FE)纳米线(NW)pFET的栅极上 0.5 0.5 Ø 2 (HZO)栅极电介质双向呈现低于60 mV / dec的陡峭亚阈值斜率(SS)。施加栅极偏置脉冲(V G = -1至-10 V),高迁移率Ge漏电流作为测试工具进行了监测,以捕获HZO的极化开关。已经发现,HZO可以通过最小脉冲宽度为3.6 ns的单个脉冲直接切换其极化。首次演示了脉冲宽度短至100 ps的脉冲序列触发的偏振切换。

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