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A 26 dBm 39 GHz Power Amplifier with 26.6 PAE for 5G Applications in 28nm bulk CMOS

机译:具有26.6%PAE的26 dBm 39 GHz功率放大器,适用于28nm批量CMOS中的5G应用

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Continued demand for 5G cellular connectivity in mobile handheld devices, where antenna real-estate is at a premium, necessitates high output power from individual transmitter elements. While more expensive heterogeneous and SOI CMOS process based power amplifiers (PAs) provide high Pout at good efficiencies, deep sub-μm bulk CMOS still remains the technology of choice for cost and integration benefits. This paper presents a 5G mm-Wave PA at 39 GHz that generates a saturated Pout of 26 dBm with a peak power-added efficiency (PAE) of 26.6% and a saturated power gain of 28.6 dB. The output stage utilizes compact layout & triple-well transistors to enable efficient yet reliable device stacking and a compact, 4-way, low-loss, series-parallel power combiner further enhances Pout. High average power measurements have been demonstrated during single-carrier as well as 5G NR OFDM modulations at competitive efficiencies. Long term reliability measurements using aging acceleration techniques demonstrate the robustness of the implemented PA. This PA achieves one of the highest ITRS figure-of-merit among reported 5G mm-Wave works in CMOS and also the highest output power among deep sub-μm (<;90 nm) 5G bulk CMOS PAs.
机译:天线不动产对移动手持设备中5G蜂窝连接的持续需求,要求来自各个发射器元件的高输出功率。虽然更昂贵的异构和基于SOI CMOS工艺的功率放大器(PA)提供高P out 在良好的效率下,深亚微米的块状CMOS仍然是成本和集成优势的首选技术。本文提出了一种在39 GHz频率下产生饱和P的5G mm-Wave PA out 最大功率为26 dBm,峰值功率附加效率(PAE)为26.6%,饱和功率增益为28.6 dB。输出级利用紧凑的布局和三阱晶体管来实现高效且可靠的器件堆叠,而紧凑的四路,低损耗,串并联功率组合器进一步增强了P out 。在单载波以及5G NR OFDM调制期间,已经证明了高平均功率测量结果具有竞争力。使用老化加速技术的长期可靠性测量证明了已实现PA的鲁棒性。在报道的CMOS 5G毫米波工作中,该PA达到了最高的ITRS品质因数之一,在深亚微米(<; 90 nm)的5G批量CMOS PA中达到了最高的输出功率。

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