首页> 外文会议>Electrical Performance of Electronic Packaging, 2001 >Reduced-order models based on measured S-parameters for time-frequency analysis of microwave circuits using genetic algorithms
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Reduced-order models based on measured S-parameters for time-frequency analysis of microwave circuits using genetic algorithms

机译:基于测得的S参数的降阶模型用于使用遗传算法对微波电路进行时频分析

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摘要

An efficient technique is developed to characterize the time-frequency domain behavior of microwave and RF devices characterized by its S-parameters, by means of the implementation of reduced-order models, expressed in terms of rational polynomials, into a general time domain simulator. The use of a genetics algorithm guarantees the smallest model order.
机译:通过将以有理多项式表示的降阶模型的实现方式实现为通用时域仿真器,开发了一种有效的技术来表征以其S参数为特征的微波和RF设备的时频特性。遗传算法的使用保证了最小的模型顺序。

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