This paper describes a practical test approach foranalog-to-digital converters (ADCs) based on the oscillation-teststrategy. The oscillation-test is applied to convert the ADC under testto an oscillator. The oscillation frequencies are able to monitor theADC conversion rate, differential nonlinearity (DNL) and integralnonlinearity (INL) at each quantization band edge (QBE). Using thismethod, no analog stimulus should be supplied and therefore the need fora costly precision signal generator is eliminated. Besides, as theoscillation frequency is evaluated using pure digital circuitry, testaccuracy is increased. This test approach is not limited to a specialkind of ADC. Simulations and practical implementation prove theefficiency of the proposed test approach for ADCs
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