Sensitivity Analysis of the Simulated Annealing Method to Measurement Noise for the Inversion of Subsurface Parameters of Two Layer Rough Surfaces

摘要

We have shown that the method of Simulated Annealing (SA) is capable of inverting subsurface parameters of a three-dimensional, two-layer dielectric structure with slightly rough interfaces [1]. In this work, we address the sensitivity of the Simulated Annealing to measurement noise. We also study the impact of the number of measurement parameters, i.e., number of frequency points and number of observation angles, on sensitivity of the inversion algorithm.