Relay propagation scheme for testing of MCMs on large areasubstrates

摘要

This paper addresses the issue of testing MCMs on large areasubstrates. The cost of testing MCMs may be as high as 40% of the totalmanufacturing cost. It is critical that the test process be parallelizedin order that multiple MCMs may be tested for the cost of testing oneMCM. With this objective in mind, we propose a parallel and pipelinedrelay propagation scheme for the testing of MCMs on large areasubstrates. In this scheme, the test vectors and the correspondingcorrect-response vectors are both scanned into the MCM scan chainsequentially. They are then relayed on from one MCM to the next down thechain. Simultaneously the MCMs are tested in parallel. Our algorithmallows an order of magnitude speed-up in test time over conventionalboundary scan based testing schemes