Microscopic image enhancement based on Fourier ptychography technique

摘要

Image enhancement technique is utilized to emphasize the overall or local characteristics of pictures and widely used inaerospace, and machine vision application. However, most of these techniques are mathematical algorithms based oncaptured pictures instead of the imaging process. Fourier ptychographic microscopy (FPM) is a recently developedcomputational imaging approach which stitches together low-resolution images acquired under different angles ofillumination with the same intensity in Fourier space to produce a wide-field, high-resolution complex sample image. Inthis article, a theoretical model about the illumination intensity is proposed. The effect of uneven illumination intensitycan be reduced significantly based on our model. Furthermore, the quality of the reconstructed image can be enhanced byadjusting the intensity of the illumination light corresponding to the high frequency components of the original spectrum.