A new kind of CMOS image sensor test method, which is different from test standards EMVA1288 and ESCC 25000，is proposed in this paper based on photo transfer theory by using the rough adaptive genetic algorithm (RAGA). Thistest method can measure both system gain and dark signal together by utilizing dark field grey value only in dark field.In this way the complexity of test is reduced, and high and low temperature tests and dynamic burn-in test become easyto be carried out. Without light field exposure, the stability and reliability of dark signal testing are improved in certainextent. The experiment result shows that, this new test method is available and dependable. It reduces the complexity oftest equipment and environment, simplifies test flow, shortens test duration, and decreases test cost.
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