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Investigation on tuning of WS_2/SiC band gap with an external electric field

机译:外部电场调节WS_2 / SiC带隙的研究

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An optical material WS_2 thin film on SiC substrate was synthesized. Both 15nm and 150nm thickness of WS_2 films weredeposited on a n-doped SiC substrate by pulsed laser deposition (PLD) method. Tungsten disulfide films weresuperimposed face to face, and silicon carbide was used as the electrode to apply an electric field ranging from 0Vm to0.18v m. The experimental results showed that band gap were continuously tunable from 2.017ev to 1.507ev. The firstprinciple calculation by using Quantum Espresso also was performed to simulate the band gap change with the increaseof an external electric field. It is found that the band gap of WS_2/SiC film changes from 1.973ev to 1.488ev as an electricfield applied perpendicularly to the film ranging from 0Vm to 0.18v m. The consistency of experimental results andthe first principle calculation was found.
机译:合成了SiC衬底上的光学材料WS_2薄膜。 WS_2膜的厚度分别为15nm和150nm 通过脉冲激光沉积(PLD)方法将其沉积在n掺杂的SiC衬底上。二硫化钨薄膜 面对面地叠加,碳化硅用作电极以施加0V / nm至 0.18v /纳米。实验结果表明,带隙在2.017ev至1.507ev范围内连续可调。首先 还使用Quantum Espresso进行了原理计算,以模拟带隙随增加而变化的情况。 外部电场。结果发现,WS_2 / SiC薄膜的带隙从1.9973ev变为1.488ev。 垂直施加到薄膜的电场范围为0V / nm至0.18v / nm。实验结果的一致性和 找到第一个原理计算。

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