The measurement of the spectral diffraction efficiencies of a diffraction grating is essential for improving themanufacturing technique and for assessing the grating’s function in practical applications. The drawback of the currentlypopular measurement technique is its slow speed due to the hundreds of repetitions of two kinds of time-consumingmechanical movements during the measuring process. This limitation greatly restricts the usage of this technique indynamic measurement. We present here a motionless and fast measurement technique for obtaining the spectraldiffraction efficiencies of a plane grating, effectively eliminating the aforementioned two kinds of mechanical movement.We estimate that the spectral measurement can be achieved on a millisecond timescale. Our motionless and fastmeasuring technique will find broad applications in dynamic measurement environments and mass industrial testing.
展开▼
