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Intrinsic surface feature based subaperture stitching of freeform wavefront

机译:基于内在表面特征的自由形波前子孔径拼接

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The subaperture stitching technique requires the registration of freeform subapertures into global coordinate frame beforestitching in order to compute entire freeform wavefront. A scanning Shack-Hartman Sensor (SHS) utilizes translationstages to scan the freeform surface in XY plane and measure the slope data of various subapertures. The measured slopedata is then integrated using weighted cubic spline (WCSLI) based integration method to compute the phase data. Thepositioning error during scanning causes misalignments between the measured subapertures and their nominal values.The least square based subaperture stitching methods are not capable to minimize lateral misalignment errors of freeformsubapertures and therefore degrade the performance of subaperture stitching process. In this work, we have utilizedfiducial added planes for correction of angular and rotation misalignments of an extended cubic phase plate. An intrinsicsurface feature (ISF) based registration method is used for lateral misalignment corrections. Gaussian curvature is usedas an intrinsic pattern which can be defined as one of the fundamental second order geometric properties of a surface.Any shift in the peaks of the Gaussian curvature of reference and measured subaperture corresponds to lateralmisalignments in X and Y directions and need to be minimized before registration of subaperture into global frame ofreference. After precise registrations, all the subapertures are stitched with consistent overlapping area by using leastsquare fitting method. A numerical validation of the proposed scheme is carried out which demonstrates the effectivenessof the proposed method to improve the subaperture stitching accuracy.
机译:子孔径拼接技术需要先将自由形式的子孔径配准到全局坐标系中 拼接以计算整个自由形式的波前。扫描Shack-Hartman传感器(SHS)利用翻译 扫描XY平面中的自由曲面并测量各种子孔径的斜率数据。测得的斜率 然后使用基于加权三次样条(WCSLI)的积分方法对数据进行积分,以计算相位数据。这 扫描过程中的定位误差会导致所测量的子孔径与其标称值之间的未对准。 基于最小二乘的子孔径拼接方法无法最小化自由形式的横向未对准误差 子孔径,因此会降低子孔径缝合过程的性能。在这项工作中,我们利用了 基准相加平面,用于校正扩展立方相板的角度和旋转不对准。内在的 基于表面特征(ISF)的配准方法用于横向未对准校正。使用高斯曲率 可以定义为表面的基本二阶几何特性之一的固有图案。 高斯曲率参考和测量的子孔径的峰的任何偏移都对应于横向 X和Y方向上的未对准,需要将其最小化,然后再将子孔径配准到全局 参考。精确套准后,通过使用最小 平方拟合法。对该方案进行了数值验证,证明了其有效性。 提出的方法来提高子孔径拼接精度。

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