A novel method of measuring microelectronic interconnecttransmission line parameters and discontinuity equivalent electricalparameters using multiple reflections

摘要

This paper describes a novel technique which measures theelectrical properties of transmission lines (such as microstrip) andextracts equivalent electrical parameters for discontinuities intransmission lines with remarkable precision using a modern networkanalyzer and newly developed de-embedding software. This technique hassuccessfully measured the per-unit-length inductance (L'), resistance(R'), capacitance (C'), and dielectric loss conductance (G') ofmicrostrip transmission lines made from solid copper and conductivepolymer. These materials have been studied at frequencies up to 201 MHz,and higher frequencies are possible. Discontinuities, such as an openingin the ground plane under the microstrip, have also been characterizedat frequencies up to 2400 MHz. Measurements of characteristic impedancesand skin resistances made by this method are in agreement withtheoretical models. Higher frequency measurements should be feasibleusing a higher frequency network analyzer