Test concept and experimental validation of the use ofbuilt-in-test to simplify conducted susceptibility testing of advancedtechnology integrated circuits and printed circuit boards

摘要

A description is given of the test concept and experimentalvalidation of measurement techniques which exploit built-in-test (BIT)to simplify RF susceptibility measurements of complex digital integratedcircuits (ICs) and printed circuit (PC) boards. The use of the BITcapability of VLSI devices and PC boards: (1) simplifies the hardwareand software interfaces to the device-under-test; and (2) reduces theexternal test equipment requirements. A specific example is given as tohow these techniques and procedures were applied to a self-testingAm2903 4-bit microprocessor slice test circuit. Test data are presentedwhich demonstrate the feasibility of using BIT techniques to obtainsusceptibility thresholds with a significant reduction in testcomplexity and external test equipment requirements. The limitationsassociated with using BIT techniques for susceptibilitycharacterizations of ICs and PC boards are also addressed