首页> 外文会议>Electrical Insulation and Dielectric Phenomena, 1994. IEEE 1994 Annual Report., Conference on >Analysis of polyethylene cable insulation interior by X-rayphotoelectron spectroscopy
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Analysis of polyethylene cable insulation interior by X-rayphotoelectron spectroscopy

机译:X射线分析聚乙烯电缆绝缘内部光电子能谱

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Over the past several years we studied some of the mechanisms forincipient insulation failure in polyethylene (PE). The previous studiesindicated that detectable changes with pure PE can occur on the surfaceof cavities (artificially produced), as observed by X-ray PhotoelectronSpectroscopy (XPS)-a technique that analyzes the first few atomic layersof a solid surface. These studies modeled conditions that could not bemeasured in routine utility-type test procedures. Production grade PE(usually cross-linked) has voids that range from below one μm tounder 1 mm. Also, this type of PE contains other species, e.g.,antioxidants and impurities often present in commercial products. Sincethe earlier studies were done with pure PE and cavities made for easyanalysis of the surface by XPS, the question remained, would the priorfindings be relevant to materials used by the electrical utilities? Toanswer this question the current investigation was initiated with PEinsulation from a series of cables that had undergone long-term testing.Interior surfaces created by fracturing the PE were analyzed byXPS
机译:在过去的几年中,我们研究了一些 聚乙烯(PE)的初期绝缘故障。以前的研究 表明纯PE的可检测变化可能发生在表面上 X射线光电子能观察到的(人工产生的)腔数 光谱学(XPS)-一种分析前几个原子层的技术 固体表面。这些研究模拟了无法满足的条件 在常规的实用型测试程序中进行测量。生产级PE (通常是交联的)空隙范围从1μm以下到 1毫米以下。而且,这种类型的PE还包含其他物质,例如 商业产品中经常存在抗氧化剂和杂质。自从 较早的研究是使用纯PE进行的,并且腔易于制造 用XPS分析表面,问题仍然存在, 发现是否与电力公司使用的材料有关?到 回答这个问题当前的调查是从PE开始的 一系列经过长期测试的电缆的绝缘。 通过对PE进行压裂产生的内表面进行了分析 XPS

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