首页> 外文会议>Electrical Contacts, 2000. Proceedings of the Forty-Sixth IEEE Holm Conference on >Development of an application specific integrated circuit forreduction of contact bounce in three phase contactors
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Development of an application specific integrated circuit forreduction of contact bounce in three phase contactors

机译:开发专用集成电路减少三相接触器的接触反弹

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In this paper, a miniature control device capable of reducingcontact bounce in three phase contactors is presented. The device isimplemented using Alcatel-Mietec 2 μm integrated circuit technologyand operates by controlling the strength of the kinetic energy of thefield flux by timing the coil energisation periods. The deviceperformance is evaluated through a series of tests with line-to-linevoltages of 75 and 300 V and a gap length of 2 mm. Results demonstratethat, with the appropriate input settings to the control device, it ispossible to eliminate contact bounce substantially in all three phases.The mechanical characteristics of the contactor system determine therequired setting for zero bounce. The ability to vary the input dataresults in a device which can be tailored to application with any typeof switchgear. On completion of 5000 switching operations using thecontrol device, the active area of erosion on each of the contactsurfaces is reduced by a factor of up to 28% compared with contacts fromtests where no control device is used. Furthermore, comparisons withprevious studies indicate that the majority of the erosion that occurswith controlled switching is caused by arcing during the openingoperation. Hence, it can be concluded that the frequency and duration ofthe arcs which occur during closing are substantially reduced by the useof the control device
机译:在本文中,一种微型控制装置能够减少 介绍了三相接触器中的接触弹跳。该设备是 使用Alcatel-Mietec 2μm集成电路技术实现 并通过控制 通过定时线圈的通电周期来确定磁场通量。装置 通过一系列在线测试来评估性能 电压为75和300 V,间隙长度为2 mm。结果证明 通过对控制设备进行适当的输入设置, 基本上可以消除所有三个阶段的接触反弹。 接触器系统的机械特性决定了 零反弹所需的设置。改变输入数据的能力 导致设备可以针对任何类型的应用进行量身定制 开关柜。使用以下命令完成5000次切换操作后: 控制装置,每个触点上的有效腐蚀区域 与接触面相比,表面减少了多达28% 测试不使用控制设备的地方。此外,与 先前的研究表明发生的大部分侵蚀 开关过程受控制是由打开过程中的电弧引起的 手术。因此,可以得出结论: 通过使用大大减少了关闭过程中产生的电弧 控制装置的

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