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Reliability analysis for competing failure processes with mutual dependence of the system under the cumulative shock

机译:累积冲击下系统相互依赖的竞争性故障过程的可靠性分析

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In this paper, reliability analysis is conducted for a single component system with two dependent competing failure processes, i.e., hard failure induced by external random shock and soft failure caused by continuous degradation process and additional abrupt degradation level due to random shocks. The dependence between the two failure processes is as follows: each random shock causes an additional abrupt increase in the degradation of the system, on the other hand, the total degradation decreases the threshold of the hard failure. Assume that the shock arrives according to a Homogeneous Poisson process, and the continuous degradation of the system follows a linear degradation path. The system fails when the total degradation volume exceeds the soft failure threshold level H, or the accumulated shock damage surpasses the hard failure threshold D(t), whichever occurs first. The reliability function of the system is derived. Finally, a numerical example of Micro-Electro-Mechanical System (MEMS) is provided to illustrate the implementation and effectiveness of the proposed model.
机译:在本文中,对具有两个相互依赖的竞争性故障过程的单组件系统进行可靠性分析,即由外部随机冲击引起的硬故障和由连续退化过程导致的软故障以及由于随机冲击而导致的额外突然退化水平。两种故障过程之间的相关性如下:每次随机冲击都会导致系统退化的额外突然增加,另一方面,总退化会降低硬故障的阈值。假设冲击是根据均匀泊松过程到达的,并且系统的连续退化遵循线性退化路径。当总退化量超过软故障阈值水平H或累积的冲击破坏超过硬故障阈值D(t)(以先发生者为准)时,系统将发生故障。推导了系统的可靠性函数。最后,提供了一个微机电系统(MEMS)的数值示例,以说明所提出模型的实现和有效性。

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