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Estimating the Circuit De-obfuscation Runtime based on Graph Deep Learning

机译:基于图深度学习的电路去混淆运行时间估计

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Circuit obfuscation has been proposed to protect digital integrated circuits (ICs) from different security threats such as reverse engineering by introducing ambiguity in the circuit, i.e., the addition of the logic gates whose functionality cannot be determined easily by the attacker. In order to conquer such defenses, techniques such as Boolean satisfiability-checking (SAT)-based attacks were introduced. SAT-attack can potentially decrypt the obfuscated circuits. However, the deobfuscation runtime could have a large span ranging from few milliseconds to a few years or more, depending on the number and location of obfuscated gates, the topology of the obfuscated circuit and obfuscation technique used. To ensure the security of the deployed obfuscation mechanism, it is essential to accurately pre-estimate the deobfuscation time. Thereby one can optimize the deployed defense in order to maximize the deobfuscation runtimeHowever, estimating the deobfuscation runtime is a challenging task due to 1) the complexity and heterogeneity of the graph-structured circuit, 2) the unknown and sophisticated mechanisms of the attackers for deobfuscation, 3) efficiency and scalability requirement in practice. To address the challenges mentioned above, this work proposes the first machine-learning framework that predicts the deobfuscation runtime based on graph deep learning. Specifically, we design a new model, ICNet with new input and convolution layers to characterize the circuit’s topology, which is then integrated by composite deep fully-connected layers to obtain the deobfuscation runtime. The proposed ICNet is an end-to-end framework that can automatically extract the deter-minant features required for deobfuscation runtime prediction. Extensive experiments on standard benchmarks demonstrate its effectiveness and efficiency beyond many competitive baselines.
机译:已经提出了电路模糊处理,以通过在电路中引入歧义性来保护数字集成电路(IC)免受诸如逆向工程之类的不同安全威胁,即,添加功能不易被攻击者确定的逻辑门。为了克服这种防御,引入了诸如基于布尔可满足性检查(SAT)的攻击之类的技术。 SAT攻击可能会解密被混淆的电路。但是,根据混淆门的数量和位置,混淆电路的拓扑结构和所使用的混淆技术,去混淆运行时的范围可能从几毫秒到几年甚至更长不等。为了确保部署的模糊处理机制的安全性,必须准确地预先估计模糊处理时间。因此,可以优化部署的防御以使去模糊时间最大化,但是,由于以下原因,估计去模糊时间是一项艰巨的任务:1)图结构电路的复杂性和异构性; 2)攻击者未知且复杂的去模糊机制,3)实践中对效率和可伸缩性的要求。为了解决上述挑战,这项工作提出了第一个机器学习框架,该框架基于图深度学习来预测去模糊运行时间。具体来说,我们设计了一个新模型ICNet,该模型具有新的输入和卷积层以表征电路的拓扑,然后将其与复合的深层全连接层集成在一起,以获得去模糊化运行时间。提议的ICNet是一个端到端框架,可以自动提取去模糊运行时预测所需的决定性功能。在标准基准上进行的大量实验证明,其有效性和效率超出了许多竞争基准。

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