首页> 外文会议>IEEE Custom Integrated Circuits Conference >A 0.0285mm2 0.68pJ/bit Single-Loop Full-Rate Bang-Bang CDR without Reference and Separate Frequency Detector Achieving an 8.2(Gb/s)/µs Acquisition Speed of PAM-4 data in 28nm CMOS
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A 0.0285mm2 0.68pJ/bit Single-Loop Full-Rate Bang-Bang CDR without Reference and Separate Frequency Detector Achieving an 8.2(Gb/s)/µs Acquisition Speed of PAM-4 data in 28nm CMOS

机译:0.0285mm 2 0.68pJ / bit单环路全速率Bang-Bang CDR,无需参考和独立的频率检测器,可在28nm速度下获得8.2(Gb / s)/ µs的PAM-4数据采集速度CMOS

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A single-loop full-rate bang-bang CDR without the reference and separate frequency detector (FD) is reported. Its phase detector innovates a strobe-point selection scheme and a hybrid control circuit to automate and accelerate the frequency acquisition over a wide frequency range. Prototyped in 28nm CMOS, our CDR achieves a 23-to-29Gb/s capture range of four-level pulse amplitude modulation (PAM-4) data. The acquisition speed [8.2(Gb/s)/µs], die area (0.0285mm2) and energy efficiency (0.68pJ/bit) compare favorably with the prior art.
机译:报告了没有参考和独立频率检测器(FD)的单回路全速率bang-bang CDR。它的相位检测器创新了频闪点选择方案和混合控制电路,可在较宽的频率范围内自动化并加速频率采集。我们的CDR以28nm CMOS为原型,实现了四电平脉冲幅度调制(PAM-4)数据的23至29Gb / s捕获范围。采集速度[8.2(Gb / s)/ µs],芯片面积(0.0285mm 2 )和能量效率(0.68pJ /位)与现有技术相比是有利的。

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