Monitoring of BTI and HCI Aging in SRAM Decoders

摘要

Bias Temperature Instability (BTI) and Hot Carrier Injection (HCI) phenomena degrade seriously the reliability of an SRAM. Such phenomena affect all SRAM blocks; among them the Address Decoders. Over-aged Decoders lead to potential read and/or write failures. It is imperative to develop design techniques that provide aging-tolerance in order to retain the SRAM reliable operation. An embedded circuit for the BTI and HCI aging monitoring in SRAM Decoders is presented along with an approach to react for memory repair after aging detection.