Analysis of Soft-Faults induced by IEMI in Elementary Functions and Complex Electronics

摘要

Many papers were devoted to the detection and analysis of effects induced by intentional electromagnetic interference on electronic devices. Most of studies have shown the possibility of analyzing failures when devices are exposed to specific electromagnetic waves. In this paper, we propose to instrument the operating system of multiple devices to gather and process in real-time software failures to detect and classify effects induced during parasitic exposure. A replication of elementary functions has been performed to characterize the point of failures of a complex system.