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MECHANICAL CHARACTERIZATION STUDY OF SINTERED SILVER PASTES BONDED IN A DOUBLE-LAP CONFIGURATION

机译:双层搭接的烧结银浆的机械表征研究

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Sintered silver-based bonded interfaces are a critical enabling technology for high-temperature, compact, high-performance, and reliable wide-bandgap packages and components. High-pressure (~40 MPa) sintered silver interfaces have been implemented commercially, most notably the commercial products offered by Semikron. To reduce manufacturing complexity, there is significant industry interest in pressure-less sintered silver interfaces. To this end, current formulations of sintered silver paste are comprised of purely nano-sized silver particles or a combination of nano- and micro-sized silver particles/flakes. It is essential to quantify the mechanical properties and determine the reliability of these interfaces prior to use in automotive power electronics applications. In this paper, research efforts at the National Renewable Energy Laboratory, in collaboration with Virginia Polytechnic Institute and State University and an industry partner, in optimizing the synthesis procedure and mechanical characterization of sintered silver double-lap samples are described. These double-lap samples were synthesized using pressure-less sintering techniques. Shear testing was conducted at multiple temperatures and displacement rates on these samples sintered using two types of sintered sintered silver pastes, one of them consisting of nano-silver particles and the other a hybrid paste or a combination of nano- and micron-sized silver flakes, employed in a double-lap configuration. Maximum values of shear stress obtained from the characterization study are reported.
机译:烧结的银基粘合界面是用于高温,紧凑,高性能,可靠的宽带隙封装和组件的关键使能技术。高压(〜40 MPa)烧结银界面已经在商业上实现,最著名的是赛米控提供的商业产品。为了降低制造复杂性,业界对无压力烧结银界面产生了浓厚的兴趣。为此,目前的烧结银浆配方由纯纳米尺寸的银颗粒或纳米尺寸和微米尺寸的银颗粒/薄片的组合组成。在汽车电力电子应用中使用之前,必须量化机械性能并确定这些接口的可靠性。在本文中,描述了在国家可再生能源实验室,弗吉尼亚理工学院和州立大学以及行业伙伴的合作下,为优化烧结银双搭接样品的合成程序和力学性能而进行的研究工作。使用无压烧结技术合成了这些双搭接样品。使用两种类型的烧结银浆,在多种温度和位移速率下对这些样品进行了剪切测试,其中一种是由纳米银颗粒组成,另一种是混合糊剂,或者是纳米和微米尺寸的银薄片的组合。 ,采用双圈配置。报告了从表征研究获得的剪切应力的最大值。

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