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Locating and Quantifying Through Circular Damage in CNT/GFRP Composite Panel Using Gaussian Fit

机译:使用高斯拟合对CNT / GFRP复合板中的圆形损伤进行定位和量化

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Previously published articles on detecting damage in electrically conductive panels mainly concentrate on electrical impedance tomography methods (EIT) which are based on using surface bounded boundary electrodes and taking advantage of an electrically conductive layer on the surface of the panel or of a conductive matrix material. In this study instead, embedded electrodes in glass fiber reinforced epoxy panels are used to locate and quantify the artificial damage inflicted on the panel. The panel was manufactured using vacuum infusion method. It consisted of 10 (S-2) glass fabric plies, where copper electrodes were embedded below the top layer and then vacuum infused with carbon nanotube (CNT) mixed epoxy. During all measurements, a constant electrical current was supplied from two outer electrodes (the source and sink) and changes in voltage from the two inner probes were recorded. In contrast to EIT methods, no complicated algorithm is used to solve the conductivity distribution of the panel but instead, a simple algorithm that fits Gaussian curves to the data obtained using a four-probe measurement technique. Using the fitted curves, we are able to detect location and magnitude of the damages within a confidence bound. This practical method reduces computational cost and also enables the use of embedded electrodes which could provide more durability for the sensors. The experimental data is in very good agreement with the finite element simulations. Comparison of relative voltage change before and after the damages is consistent and sensitive enough to detect damages down to 1/8" diameter hole inside an area of 33 in2. As expected, accuracy is higher for larger diameter holes.
机译:先前发表的关于检测导电面板中的损伤的文章主要集中在电阻抗层析成像方法(EIT)上,该方法基于使用表面有界的边界电极并利用面板表面上的导电层或导电基质材料的优点。相反,在这项研究中,使用玻璃纤维增​​强环氧树脂面板中的嵌入式电极来定位和量化对面板造成的人为损坏。面板是使用真空灌注法制造的。它由10个(S-2)玻璃纤维布层组成,其中铜电极埋在顶层下方,然后真空注入碳纳米管(CNT)混合环氧树脂。在所有测量过程中,从两个外部电极(源极和接收器)提供恒定的电流,并记录来自两个内部探针的电压变化。与EIT方法相比,没有使用复杂的算法来解决面板的电导率分布,而是使用了一种简单的算法,该算法将高斯曲线拟合到使用四探针测量技术获得的数据。使用拟合的曲线,我们能够在置信范围内检测损坏的位置和大小。这种实用的方法减少了计算成本,还可以使用嵌入式电极,这可以为传感器提供更高的耐用性。实验数据与有限元模拟非常吻合。损伤前后相对电压变化的比较是一致的,并且足够灵敏,足以检测到在面积为33 in2的小至1/8“直径孔中的损伤。正如预期的那样,大直径孔的精度更高。

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