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Intra-pixel response characterization of a HgCdTe near infrared detector with a pronounced Crosshatch pattern

机译:具有明显的交叉阴影线图案的HgCdTe近红外探测器的像素内响应特性

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The "crosshatch" pattern is a recurring "feature" of HgCdTe arrays, specifically the Teledyne HAWAII family of near infrared detectors. It is a fixed pattern of high frequency QE variations along 3 directions generally thought, to be related to the crystal structure of HgCdTe. The pattern is evident in detectors used in WFC3/IR, WISE, JWST, and in candidate detectors for Euclid and WFIR.ST. Using undersampled point sources projected onto a HAWAII-2RG detector, we show that the pattern induces photometric variations that are not removed by a flat-field calibration, thus demonstrating that the QE variations occur on scales smaller than the 18 micron pixels. Our testbed is the Precision Projector Laboratory's astronomical scene generator, which can rapidly characterize the full detector by scanning thousands of undersampled spots. If not properly calibrated, detectors showing strong Crosshatch may induce correlated errors in photometry, astrometry, speetroscopy. and shape measurements.
机译:“交叉影线”图案是HgCdTe阵列(特别是Teledyne HAWAII系列近红外探测器)的重复“特征”。它是通常沿3个方向发生的高频QE变化的固定模式,与HgCdTe的晶体结构有关。在WFC3 / IR,WISE,JWST中使用的检测器以及Euclid和WFIR.ST的候选检测器中,该模式都很明显。使用投影到HAWAII-2RG检测器上的欠采样点源,我们显示出该图案会引起光度变化,而该变化无法通过平场校准消除,因此证明了QE变化发生在小于18微米像素的范围内。我们的测试平台是精密投影仪实验室的天文场景生成器,它可以通过扫描数千个欠采样点来快速表征整个探测器。如果未正确校准,则显示出交叉阴影线的检测器可能会在光度法,天文测量法,立体镜法中引起相关的误差。和形状测量。

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