Synchronous interferometric broadband measurement of dispersion applied to manufacturing optimization of microstructured optical fibers

摘要

An interferometric method to measure chromatic dispersion using a single picosecond pulsed SC source of fixed repetition rate applied to the design and fabrication of customized supercontinuum sources is presented. Optimum visibility of fringes has been obtained by synchronized control of pulse overlapping within the full VIS-NIR range down to a resolution of less than 1nm. This method simplifies very significantly the long and tedious state-of-the-art interferometric methods based in several SLEDs as illumination sources.