Simplified approach for tomographic diffractive microscopy of axisymmetric samples

摘要

Tomographic diffractive microscopy (TDM) is an imaging technique which allows for recording the complex optical index of unlabelled specimens. It is based on diffraction theory with a spatially coherent illumination and interference demodulation. Different methods have been developped like illumination rotation with fixed sample or sample rotation with fixed illumination. However this last technique is difficult to set up. Hence, we propose a novel reconstruction technique applicable to axisymmetric unlabelled specimens. It consists in a numerical rotation of the Ewald cap of sphere generated by a zero-degree illumination on the sample. Due to the specimen symmetry, we show that the Fourier space can be filled in the direction perpendicular to the axis of symmetry.